A Low Noise and Reliable CMOS I/O Buffer for Mixed Low Voltage Applications
نویسنده
چکیده
Abstract: In this paper the design of a high voltage tolerant and reliable CMOS I/O buffer is proposed without using thick-oxide devices. In this presented design for mixed low voltage interface applications, it uses a simpler structure and therefore the circuit has good gate-oxide reliability. In addition, it is free of dc leakage current. No additional pad for dual power supplies is required in the proposed circuit. The pull-up operation including both the rise-time and power-delay product is reduced about 20%. The simple structure leads to 50% area saving as compared to the existing prior art.
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